Fundamentals of Metrology and Quality Control MECH 3010

Upon successful completion, the student will be able to:

• Recognize the need for quality control and metrology that results from dimensional variation in manufactured parts.
• Describe, select, and use common dimensional inspection equipment including scales, calipers, micrometers, gauge blocks, surface plates, height gauges, and Coordinate Measuring Machines.
• Interpret drawings and apply requirements in various inspection and test activities.
• Determine which measurement instrument to use in various situations based on considerations such as the characteristic to be measured, the 10:1 rule, the required accuracy level, uncertainty.
• Select, construct, apply, and interpret the seven quality tools: cause and effect diagrams, flow charts (process maps), check sheets, Pareto diagrams, scatter diagrams, control charts, and histograms.
• Identify and define sampling characteristics such as operating characteristic (OC) curve, lot size, sample size, acceptance number, switching rules.
• Design acceptance sampling plans according to Mil-Std-105E and ANSI/ASQC Z1.4 standards.
• Identify and differentiate between statistical terms such as population, sample, parameter, statistic, statistical process control, statistical quality control.
• Define, compute, and interpret measures of central tendency (mean, median, and mode) and dispersion (standard deviation, range, and variance).
• Calculate process yield and percent defectives using areas under the normal curve.
• Identify, select, construct, and interpret variables control charts such as X-bar and R.
• Define the prerequisites for capability, and calculate and interpret Cp and Cpk in various situations.

Effective as of Fall 2004